Abstarct:

A simple demo of a characterization or Silicon Validation experiment handled entirely with 1 single instrument the SLT3G1 All-In-One Electronic Tester. The experiment consists of measuring the Quiescent current of a widely reknown linear Voltage Regulator NCP1117

Audience

• Electronic device App, Charac, Silicon Validation, and Test engineers
• Professors, lab teaching assistants
• Undergraduate and Graduate Engineers (EE, Embedded System, IoT)

beginTask 0 0 0 VRINIT;

   ldoDisableOutput 0 0 1;

   ldoSetVoutClamp 5.0 0 1;

   ldoSetIoutClamp 0.8 0 1;

   ldoSetVout 4.0 0 1;

   ldoEnableOutput 0 0 1;

   currentSrcSetIoutClamp 100.0;

   setUsrFloatVar 4.7 0 2;

  setRsRefLabel 0 0 1 Vin;      Label1 = “Vin”

   setRsRefLabel 0 0 2 Iin;   

   setRsRefLabel 0 0 3 Vout;   

   setRsRefLabel 0 0 4 Iout;     Label4 = "Iout“

   currentSrcSetIoutStep 5;   current increment in mA

   setUsrFloatVar 4.7 0 2;      xrVAR2 = 4.7 ohm Iout sense

   currentSrcSetIoutStep 5;

   currentSrcEnable;

   currentSrcSetIout 0.0;                initial current source

endTask;

beginTask 0.0 0 0 VRMEAS;

  currentSrcEnable;

   delayms 10;

   ldoSetVout 4.0 0 1;            set DPS Vout1 = 4.0V, iterates

   ldoGetVout 0 0 1;              returns VOUT1

   ldoGetIout 0 0 1;               returns IOUT1

   getSingleExtMeas 3 1 8;   returns ANA1.8 with Label3 = VOUT

   getDiffExtMeas 0.0 8 8;

   getKtype 0.0 0 2;               Reports K-Type probe temperature

   divFloat 0 xrEXT_DIFF_MEAS xrVAR2; 

   getFloatVar 0 4 0;          returns xrREG0 with Label 4

   currentSrcIncrIout;        increments DAC Iout by 5mA

   currentSrcDisable;

   delayms 50;

endTask;